#1
20th December 2016, 05:47 PM
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Scanning Electron Microscope in Niper Mohali
Hello I would like to have the information about the Variable Pressure Scanning Electron Microscope (SEM) Hitachi S3400N available at Niper, Mohali?
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#2
21st December 2016, 09:01 AM
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Re: Scanning Electron Microscope in Niper Mohali
The information about the Variable Pressure Scanning ElectronMicroscope (SEM) Hitachi S3400N available at Niper, Mohali is as given below: Variable Pressure Scanning ElectronMicroscope (SEM) Hitachi S3400N Make: Hitachi Model: S3400N Type of Experiments Proposed Charges for Industry/private institutes Per sample Imaging (normal) using carbon or gold coating Rs. 2500 Per sample Imaging (Using cooling stage) Rs. 4000 Elemental analysis by EDS per sample Rs. 2500 CPD Per sample Rs. 500 Per sample Imaging (normal) using carbon or gold coating Rs. 2500 Resolution: SE Image -3 nm at 30 KV in High Vacuum mode; 10 nm at 3 KV in High Vacuum mode; BSE Image 4 nm at 30 KV in variable pressure mode. Detectors: Secondary Electron Detector; High sensitivity 5 Quadrant Semiconductor type;Back Scattered Electron Detector (BSED);Environmental Secondary Electron Detector; Thermo EDS System Free X-ray Super Dry Si (Li) Detector II with Light window for elemental analysis from Be/B to Uranium. Deben Cooling stage (-25 to +50oC); Critical point drier available. Application areas: Biology, Geology, Metallurgy, Material Science. Sample nature for analysis: Liquid, solid, tissues, cells etc. CPD (Critical Point Drying) |
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