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21st December 2016, 09:01 AM
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Join Date: Mar 2013
Re: Scanning Electron Microscope in Niper Mohali

The information about the Variable Pressure Scanning ElectronMicroscope (SEM) Hitachi S3400N available at Niper, Mohali is as given below:

Variable Pressure Scanning ElectronMicroscope (SEM) Hitachi S3400N
Make: Hitachi
Model: S3400N

Type of Experiments
Proposed Charges for Industry/private institutes
Per sample Imaging (normal) using carbon or gold coating
Rs. 2500

Per sample Imaging
(Using cooling stage)
Rs. 4000

Elemental analysis by EDS per sample
Rs. 2500

CPD Per sample
Rs. 500

Per sample Imaging (normal) using
carbon or gold coating
Rs. 2500

Resolution:
SE Image -3 nm at 30 KV in High Vacuum mode; 10 nm at 3 KV in High Vacuum mode; BSE Image 4 nm at 30 KV in variable pressure mode.

Detectors:

Secondary Electron Detector; High sensitivity 5 Quadrant Semiconductor type;Back Scattered Electron

Detector (BSED);Environmental Secondary Electron Detector; Thermo EDS System Free X-ray Super Dry Si (Li)
Detector II with Light window for elemental analysis from Be/B to Uranium. Deben Cooling stage (-25 to +50oC); Critical point drier available.

Application areas:
Biology, Geology, Metallurgy, Material Science. Sample nature for analysis: Liquid, solid, tissues, cells etc. CPD (Critical Point Drying)


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